演讲嘉宾-Andrew J. Pollard

Andrew J. Pollard
国家物理实验室,英国
  在2009年加入国家物理实验室后,Andrew正在引领表面和纳米分析小组研究石墨烯及相关材料2D的结构和化学特性,重点为了在这一领域实现产业商业化。此计量研究涉及2D的材料的具有一系列表面表征技术,如拉曼光谱和尖端增强拉曼光谱(字符),扫描探针显微术(SPM),扫描电子显微镜(SEM),二次离子质谱法的实际测量(SIMS)和X射线光电子能谱(XPS)。
  Andrew是ISO的“纳米技术”技术委员会(TC229)中“测量和表征”工作组的成员,和英国提名的目前在国际标准发展ISO / IEC / tc113 TC229的专家。他作为NGMC行业标准化的领导者,领导了ISO / TC229中的两个国际标准,和世界各地的公司从事生产或使用石墨烯。Andrew是曼彻斯特大学全国石墨协会(NGI)学术客座教授,VAMAS技术工作区“TWA41:石墨烯及相关二维材料”的联合主席,并且是几个石墨烯实体的顾问委员会成员。
演讲题目:International Standardisation of Graphene: Terminology and Characterisation Enabling Commercial Applications
主题会场石墨烯标准化论坛&中英石墨烯双边合作论坛
开始时间
结束时间
内容摘要

There are many application areas where graphene and related 2D materials may be disruptive, areas such as flexible electronics, nanocomposites, sensing, filtration membranes and energy storage. Applying metrology to the area of graphene is now paramount to enable the emerging global graphene industry and bridge the gap between academia and industry. Measurement capabilities and expertise for a wide range of scientific areas are required to address this challenge. The combined and complementary approach of varied characterisation methods for structural, chemical and electrical properties, will allow the real-world issues of commercialising graphene and other 2D materials, such as determining the suitability and realistic performance enhancement of graphene-enabled products for the many different types of graphene.
As the UK’s leading National Measurement Institute (NMI), the National Physical Laboratory (NPL) is uniquely positioned to enable the commercialisation of graphene through the application of metrology in this area. This measurement research has been used directly to develop international standards within the International Organization for Standardization (ISO) and International Electrotechnical Commission (IEC), within their ‘Nanotechnologies’ Technical Committees, TC229 and TC113 respectively. Here, two international standards currently under development and led by NPL will be described, ‘ISO/TS 80004-13: Nanotechnologies - Vocabulary - Part 13: Graphene and related two-dimensional materials’ and ‘ISO/PWI 21356: Nanotechnologies - Structural characterization of graphene’.

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联系我们
400-110-3655   

E-mail: meeting@c-gia.cn   meeting01@c-gia.cn

参展电话:13646399362(苏老师)

主讲申请:19991951101(王老师)

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凯发_Andrew J. Pollard

凯发

演讲嘉宾-Andrew J. Pollard

Andrew J. Pollard
国家物理实验室,英国
  在2009年加入国家物理实验室后,Andrew正在引领表面和纳米分析小组研究石墨烯及相关材料2D的结构和化学特性,重点为了在这一领域实现产业商业化。此计量研究涉及2D的材料的具有一系列表面表征技术,如拉曼光谱和尖端增强拉曼光谱(字符),扫描探针显微术(SPM),扫描电子显微镜(SEM),二次离子质谱法的实际测量(SIMS)和X射线光电子能谱(XPS)。
  Andrew是ISO的“纳米技术”技术委员会(TC229)中“测量和表征”工作组的成员,和英国提名的目前在国际标准发展ISO / IEC / tc113 TC229的专家。他作为NGMC行业标准化的领导者,领导了ISO / TC229中的两个国际标准,和世界各地的公司从事生产或使用石墨烯。Andrew是曼彻斯特大学全国石墨协会(NGI)学术客座教授,VAMAS技术工作区“TWA41:石墨烯及相关二维材料”的联合主席,并且是几个石墨烯实体的顾问委员会成员。
演讲题目:International Standardisation of Graphene: Terminology and Characterisation Enabling Commercial Applications
主题会场石墨烯标准化论坛&中英石墨烯双边合作论坛
开始时间
结束时间
内容摘要

There are many application areas where graphene and related 2D materials may be disruptive, areas such as flexible electronics, nanocomposites, sensing, filtration membranes and energy storage. Applying metrology to the area of graphene is now paramount to enable the emerging global graphene industry and bridge the gap between academia and industry. Measurement capabilities and expertise for a wide range of scientific areas are required to address this challenge. The combined and complementary approach of varied characterisation methods for structural, chemical and electrical properties, will allow the real-world issues of commercialising graphene and other 2D materials, such as determining the suitability and realistic performance enhancement of graphene-enabled products for the many different types of graphene.
As the UK’s leading National Measurement Institute (NMI), the National Physical Laboratory (NPL) is uniquely positioned to enable the commercialisation of graphene through the application of metrology in this area. This measurement research has been used directly to develop international standards within the International Organization for Standardization (ISO) and International Electrotechnical Commission (IEC), within their ‘Nanotechnologies’ Technical Committees, TC229 and TC113 respectively. Here, two international standards currently under development and led by NPL will be described, ‘ISO/TS 80004-13: Nanotechnologies - Vocabulary - Part 13: Graphene and related two-dimensional materials’ and ‘ISO/PWI 21356: Nanotechnologies - Structural characterization of graphene’.

关于主办方

联系我们
400-110-3655   

E-mail: meeting@c-gia.cn   meeting01@c-gia.cn

参展电话:13646399362(苏老师)

主讲申请:19991951101(王老师)

官方微信订阅号
Copyright © 中国国际石墨烯创新大会 版权所有     运营机构:北京现代华清材料科技发展有限责任公司
grapchina.org 京ICP备10026874号-12   grapchina.cn 京ICP备10026874号-23
京公网安备 11010802023402号
分享到: