演讲嘉宾-肖思群

肖思群
FEI公司(中国)业务发展部总监
Siqun Xiao received his B.S. in materials science and engineering in 1982 from Zhejiang University China, Dipl. Ing. in metallurgy from RWTH Aachen 1986 and Dr. rer. nat. in metal physics from University of Goettingen 1990. 1990-1993 he served as Sr. Research Associate in the department of materials science and engineering at Case Western Reserve University in Cleveland, USA. Then in 1993-1996 he became post-doctoral fellow at the National Center for Electron Microscopy of Lawrence Berkeley Lab, Berkeley, USA. Currently Siqun Xiao is Director for Business development at FEI Company in China.
演讲题目:Titan Themis-The New Aberration Corrected S/TEM - Its Application in Graphene/CNT and Catalytic Proc
主题会场
开始时间
结束时间
内容摘要

Spherical aberration (Cs) corrected S/TEM is receiving more and more attention from the materials research and nano research scientists due to its unique imaging capability at atomic resolution. An environmental TEM (ETEM) with Cs correction makes it possible to study in-situ the gas-solid reaction at atomic resolution. From instrumentation point of view it is discussed the potential of such instrument in studying the structure and behavior of graphene, carbon nano-tube as well as the catalytic process of nm-sized particles.

关于主办方

联系我们
400-110-3655   

E-mail: meeting@c-gia.cn   meeting01@c-gia.cn

参展电话:13646399362(苏老师)

主讲申请:19991951101(王老师)

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凯发_肖思群

凯发

演讲嘉宾-肖思群

肖思群
FEI公司(中国)业务发展部总监
Siqun Xiao received his B.S. in materials science and engineering in 1982 from Zhejiang University China, Dipl. Ing. in metallurgy from RWTH Aachen 1986 and Dr. rer. nat. in metal physics from University of Goettingen 1990. 1990-1993 he served as Sr. Research Associate in the department of materials science and engineering at Case Western Reserve University in Cleveland, USA. Then in 1993-1996 he became post-doctoral fellow at the National Center for Electron Microscopy of Lawrence Berkeley Lab, Berkeley, USA. Currently Siqun Xiao is Director for Business development at FEI Company in China.
演讲题目:Titan Themis-The New Aberration Corrected S/TEM - Its Application in Graphene/CNT and Catalytic Proc
主题会场
开始时间
结束时间
内容摘要

Spherical aberration (Cs) corrected S/TEM is receiving more and more attention from the materials research and nano research scientists due to its unique imaging capability at atomic resolution. An environmental TEM (ETEM) with Cs correction makes it possible to study in-situ the gas-solid reaction at atomic resolution. From instrumentation point of view it is discussed the potential of such instrument in studying the structure and behavior of graphene, carbon nano-tube as well as the catalytic process of nm-sized particles.

关于主办方

联系我们
400-110-3655   

E-mail: meeting@c-gia.cn   meeting01@c-gia.cn

参展电话:13646399362(苏老师)

主讲申请:19991951101(王老师)

官方微信订阅号
Copyright © 中国国际石墨烯创新大会 版权所有     运营机构:北京现代华清材料科技发展有限责任公司
grapchina.org 京ICP备10026874号-12   grapchina.cn 京ICP备10026874号-23
京公网安备 11010802023402号
分享到: