演讲题目:Titan Themis-The New Aberration Corrected S/TEM - Its Application in Graphene/CNT and Catalytic Proc
内容摘要
Spherical aberration (Cs) corrected S/TEM is receiving more and more attention from the materials research and nano research scientists due to its unique imaging capability at atomic resolution. An environmental TEM (ETEM) with Cs correction makes it possible to study in-situ the gas-solid reaction at atomic resolution. From instrumentation point of view it is discussed the potential of such instrument in studying the structure and behavior of graphene, carbon nano-tube as well as the catalytic process of nm-sized particles.